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focused beam methods
John W. Schultz
(Author)
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Createspace Independent Publishing Platform
· Paperback
focused beam methods - Schultz, John W.
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Origin: U.S.A.
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Synopsis "focused beam methods"
Determining the intrinsic microwave properties of materials is important for a variety of applications ranging from antenna and electronic circuit design to remote sensing to electromagnetic interference mitigation. A number of methods exist for characterizing intrinsic properties of materials at microwave frequencies, including transmission lines, resonant cavities, and impedance analysis. The use of free-space measurement methods has become commonplace among microwave material characterization laboratories due to its ease of use and reasonable accuracy. While some free-space facilities exist that can characterize down to 500 MHz, the method is most useful for characterizing materials from 2 GHz through millimeter waves. This book is designed to acquaint engineers and scientists with the theory and practice of using microwave focused beam systems for free-space characterization of materials.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.
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