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Key Concepts of Scanning Electron Microscopy
Ny Research Press (Author)
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Ny Research Press
· Hardcover
Key Concepts of Scanning Electron Microscopy - Ny Research Press
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Origin: U.S.A.
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Synopsis "Key Concepts of Scanning Electron Microscopy"
This book on scanning electron microscopy examines the key concepts employed in the field. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical applications. It further includes numerous topics on geoscience, instrumentation, mineralogy, thin films, biology, ceramic and materials for electronic industry. This book includes contributions by renowned researchers and experts in this field.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.
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