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X-Ray Structure Analysis
Theo Siegrist
(Author)
·
de Gruyter
· Paperback
X-Ray Structure Analysis - Siegrist, Theo
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Origin: U.S.A.
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Synopsis "X-Ray Structure Analysis"
This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.
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