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Advanced Mathematical and Computational Tools in Metrology and Testing XII
Franco Pavese
(Illustrated by)
·
Alistair B. Forbes
(Illustrated by)
·
Nien Fan Zhang
(Illustrated by)
·
World Scientific Publishing Company
· Hardcover
Advanced Mathematical and Computational Tools in Metrology and Testing XII - Pavese, Franco ; Forbes, Alistair B. ; Zhang, Nien Fan
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Origin: U.S.A.
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Synopsis "Advanced Mathematical and Computational Tools in Metrology and Testing XII"
This volume contains original, refereed contributions by researchers from national metrology institutes, universities and laboratories across the world involved in metrology and testing. The volume has been produced by the International Measurement Confederation Technical Committee 21, Mathematical Tools for Measurements and is the twelfth in the series. The papers cover topics in numerical analysis and computational tools, statistical inference, regression, calibration and metrological traceability, computer science and data provenance, and describe applications in a wide range of application domains. This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. It will also be of interest to scientists and engineers concerned with the reliability, trustworthiness and reproducibility of data and data analytics in data-driven systems in engineering, environmental and life sciences.
