Share
Failure Analysis: High Technology Devices (de Gruyter Stem)
Daniel J. D. Sullivan
(Author)
·
Eric J. Carleton
(Author)
·
de Gruyter
· Paperback
Failure Analysis: High Technology Devices (de Gruyter Stem) - Sullivan, Daniel J. D. ; Carleton, Eric J.
Choose the list to add your product or create one New List
✓ Product added successfully to the Wishlist.
Go to My Wishlists
Origin: U.S.A.
(Import costs included in the price)
It will be shipped from our warehouse between
Thursday, June 27 and
Monday, July 15.
You will receive it anywhere in United Kingdom between 1 and 3 business days after shipment.
Synopsis "Failure Analysis: High Technology Devices (de Gruyter Stem)"
The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
- 0% (0)
- 0% (0)
- 0% (0)
- 0% (0)
- 0% (0)
All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.
✓ Producto agregado correctamente al carro, Ir a Pagar.
