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Mos Interface Physics, Process and Characterization
Shengkai Wang Xiaolei Wang (Author)
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Crc Press
· Paperback
Mos Interface Physics, Process and Characterization - Shengkai Wang Xiaolei Wang
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Synopsis "Mos Interface Physics, Process and Characterization"
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.
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