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portada Nanometer-Scale Resistivity of Copper Films and Interconnects: Simulation and Measurement of Nanometer-Scale Resistivity of Copper Films for Interconnect Applications
Type
Physical Book
Publisher
Author
Format
Paperback
ISBN13
9783639167702

Nanometer-Scale Resistivity of Copper Films and Interconnects: Simulation and Measurement of Nanometer-Scale Resistivity of Copper Films for Interconnect Applications

Arif Emre Yar¿Mb¿Y¿K (Author) · Vdm Verlag · Paperback

Nanometer-Scale Resistivity of Copper Films and Interconnects: Simulation and Measurement of Nanometer-Scale Resistivity of Copper Films for Interconnect Applications - Arif Emre Yar¿mb¿y¿k

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Origin: Spain (Import costs included in the price)
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