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on line-testing for vlsi
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Origin: U.S.A.
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Friday, July 05 and
Wednesday, July 17.
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Synopsis "on line-testing for vlsi"
test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. in its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. on-line testing for vlsi contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. the contributions are largely derived from recent ieee international on-line testing workshops. guest editors michael nicolaidis, yervant zorian and dhiraj pradhan organized the articles into six chapters. in the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. on-line testing for vlsi is an edited volume of original research comprising invited contributions by leading researchers.
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The book is written in English.
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