Share
Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Woodhead Publishing Series in Electronic and Optical Materials)
Yasuo Cho (Author)
·
Woodhead Publishing
· Paperback
Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Woodhead Publishing Series in Electronic and Optical Materials) - Yasuo Cho
£ 139.50
£ 155.00
You save: £ 15.50
Choose the list to add your product or create one New List
✓ Product added successfully to the Wishlist.
Go to My WishlistsIt will be shipped from our warehouse between
Wednesday, June 19 and
Monday, June 24.
You will receive it anywhere in United Kingdom between 1 and 3 business days after shipment.
Synopsis "Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Woodhead Publishing Series in Electronic and Optical Materials)"
Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.Presents an in-depth look at the SNDM materials characterization technique by its inventorReviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devicesAnalyzes key insights on semiconductor materials and device physics derived from the SNDM technique
- 0% (0)
- 0% (0)
- 0% (0)
- 0% (0)
- 0% (0)
All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.
✓ Producto agregado correctamente al carro, Ir a Pagar.