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Advances in Imaging and Electron Physics, Volume 157: Optics of Charged Particle Analyzers
Mikhail Yavor (Author)
·
Academic Press
· Hardcover
Advances in Imaging and Electron Physics, Volume 157: Optics of Charged Particle Analyzers - Mikhail Yavor
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Synopsis "Advances in Imaging and Electron Physics, Volume 157: Optics of Charged Particle Analyzers"
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.
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