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Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications
Xinmao Yin
(Author)
·
Andrew T. S. Wee
(Author)
·
Chi Sin Tang
(Author)
·
Wiley-Vch
· Paperback
Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications - Yin, Xinmao ; Wee, Andrew T. S. ; Tang, Chi Sin
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Synopsis "Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications"
Dieses Buch ist eine aktualisierte Einführung in die Anwendung der spektrometrischen Ellipsometrie mit ihrem praktischen Einsatz bei der Untersuchung von Grenzflächeneigenschaften, Elektronenstrukturen und Quasiteilcheneigenschaften verschiedener Klassen von Dünnschichtmaterialien.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.
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