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portada Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications
Type
Physical Book
Publisher
Year
2022
Language
English
Pages
208
Format
Paperback
Dimensions
24.4 x 17.0 x 1.1 cm
Weight
0.34 kg.
ISBN13
9783527349517

Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications

Xinmao Yin (Author) · Andrew T. S. Wee (Author) · Chi Sin Tang (Author) · Wiley-Vch · Paperback

Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications - Yin, Xinmao ; Wee, Andrew T. S. ; Tang, Chi Sin

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Synopsis "Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications"

Dieses Buch ist eine aktualisierte Einführung in die Anwendung der spektrometrischen Ellipsometrie mit ihrem praktischen Einsatz bei der Untersuchung von Grenzflächeneigenschaften, Elektronenstrukturen und Quasiteilcheneigenschaften verschiedener Klassen von Dünnschichtmaterialien.

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