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reliability and degradation of iii-v optical devices
Osamu Ueda
(Author)
·
Artech House Publishers
· Hardcover
reliability and degradation of iii-v optical devices - Ueda, Osamu
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Origin: U.S.A.
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Synopsis "reliability and degradation of iii-v optical devices"
Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.
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