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Secondary ion Mass Spectrometry: An Introduction to Principles and Practices
Paul Van Der Heide
(Author)
·
Wiley
· Hardcover
Secondary ion Mass Spectrometry: An Introduction to Principles and Practices - Van Der Heide, Paul
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Synopsis "Secondary ion Mass Spectrometry: An Introduction to Principles and Practices"
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) - Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations - Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission - Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) - Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions - Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.
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