Share
Semiconductor Memories: Technology, Testing, and Reliability
Ashok K. Sharma (Author)
·
John Wiley & Sons Inc
· Hardcover
Semiconductor Memories: Technology, Testing, and Reliability - Ashok K. Sharma
Choose the list to add your product or create one New List
✓ Product added successfully to the Wishlist.
Go to My Wishlists
Origin: U.S.A.
(Import costs included in the price)
It will be shipped from our warehouse between
Monday, May 27 and
Wednesday, June 12.
You will receive it anywhere in United Kingdom between 1 and 3 business days after shipment.
Synopsis "Semiconductor Memories: Technology, Testing, and Reliability"
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.
- 0% (0)
- 0% (0)
- 0% (0)
- 0% (0)
- 0% (0)
All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.
✓ Producto agregado correctamente al carro, Ir a Pagar.
